Session Index

Optical Information Processing and Holography

Optical Information Processing
Saturday, Dec. 5, 2015  13:10-14:40
Chair: 蘇威宏 (Wei-Hung Su),陳敬恆 (Jing-Heng Chen)
Room: Delta B03(B1F)
Notes:
13:10 - 13:40 Paper No.  2015-SAT-S0404-I001
Invited Speaker:
Nikolay V. Petrov
Digital Holographic Interferometry: New tools and relevant applications


In this communication a new method for investigation of volume of the particles is described. It based on the analysis of the ratio of correlation function peak to its pedestal,calculated for adjacent planes of the volume.The method was studied in the numerical experiment.

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13:40 - 13:55 Paper No.  2015-SAT-S0404-O001
Yen-Chang Chu Curvature Measurement based on Virtual Moiré Interferometry


A simple method for measuring the curvature of object is proposed based on Talbot effect and virtual moiré interferometry. To show the feasibility of this method, commercial convex mirrors were measured with resolution of 0.38 um-1.

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13:55 - 14:10 Paper No.  2015-SAT-S0404-O002
Wei Tan Polymer network liquid crystal microlens array with large tunable focal length and fast response time


We demonstrate a polymer network liquid crystal (PNLC) microlens array. While applied a voltage to the cell, the formation of polymer networks stabilizes the liquid crystal (LC) molecules at a gradient alignment. After photo-polymerization, the PNLC microlens array formed which features large electrically tunable focal length, fast response time.

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14:10 - 14:25 Paper No.  2015-SAT-S0404-O003
Ching-Hsiang Kang Face Recognition Using Depth Information


The expression and the illuminant condition usually impacts the accuracy of face recognition. In this study, we apply the depth map instead of eigen-face recognition. The result shows that this method can be more robust under different expression and illuminant condition.

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14:25 - 14:40 Paper No.  2015-SAT-S0404-O004
Guang-Hong Chen Profile Measurements for Specular Surfaces


A profile measurement technique for specular surfaces is proposed. A fringe pattern is posited in front of the inspected surface. A virtual image of the fringe pattern is formed behind the metal surface. The virtual fringes are deformed by topography of the metal object. Thus, phase of the deformed fringes is desirable to retrieve the profile of the specular surface.

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